Magwel informational videos
Here are the videos that are available for viewing on Magwel solutions and products. Right now it makes more sense to view online information right from your own computer about our technology and products. We are offering rapid turnaround on your user registration so once you sign up, you can view all of our content. Here is the current list of videos we are making available: (Click here to register with your business email)
- PTM-TR Animation Video – Transient fine-grain co-simulation of power devices in a full circuit context
- PTM-ET Webinar Video – Electro-thermal modeling over time of power devices with user defined stimulus
- PTM Webinar Video – Power device modeling to obtain Rdson and power per layer
- CDM Webinar Video
- Taiwan NCTU CDM Symposium Video
Need an effective CDM sign-off strategy?
Magwel has developed a breakthrough CDM simulation solution that computes IR-drop and current densities during CDM events. It also checks for voltage-stress on both I/O and core protected devices.
Is decoupled electrical and thermal analysis leading to thermal runaway issues?
Learn how combined concurrent electro-thermal analysis on PowerMOS devices can save designs from overheating failures.
Want to work faster while making and verifying ESD violation fixes?
This article on SemiWIki explains how fixes for ESD issues can be tested without looping back and forth between your layout editor and the ESD simulator
Need to understand detailed dynamic switching behavior inside of PowerFETs?
See this animation of PTM-TR results for a power converter MosFET pair using Magwel generated Fast3D models co-simulated with Spectre®
Snapback behavior determines ESD protection effectiveness
Read about how proper modeling of snapback devices and parallel discharge paths can lead to success or failure in properly predicting ESD protection network effectiveness.
Worried about current crowding during switching transients in power devices that could cause reliability issues in your designs?
Magwel’s PTM-TR™ is a transient switching analysis solution for device source, gate and drain nets in power and converter circuits. The power device can be simulated during circuit operation to ensure current crowding hot spots are not going to lead to device failures.
Struggling to reduce VCC-min on SRAM’s?
Learn how Magwel® RNi™ can help reduce costly VCC connection errors that contribute to a higher than necessary VCC-min.
Want to know the best location for replica and sense devices in power transistors?
Read how PTM-ET™ can help locate hot spots in power devices and provide assurance that replicas and sense devices are properly placed.
Contact us to receive a brochure or white paper on ESD analysis and Electrothermal modeling of power devices.