Substrate noise analysis with SNA

• Co-simulation of noise propagation through the substrate and the interconnect
• Modeling of minority and majority carrier injections into the substrate. Drift-diffusion modeling of carrier propagation with various carrier mobility models including carrier recombination.
• Characterization of noise isolation structures

 

Characterization of active devices with DevEM

• Import GDSII layout to analyze a full device
• Extract I-V curves and S-parameters
• Experiment with different structures without the cost of silicon
• Get compact models earlier, with less cost

Simulation of interconnect with 3DPET

• N-port network analysis
• Scattering matrix and RLCG extraction
• Full wave EM-simulations